Apparent and true feature heights in force microscopy

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Abstract
In a force microscope, the stiffness of the cantilever beam convolutes with the tip-sample interaction stiffness to influence the data in a systematic way. The analysis presented here relates the measured feature height to the true feature height in the variable force, constant force, and constant force gradient modes of operation. In this way, one can understand previously published data: the enhanced measured atomic corrugation observed in high resolution force microscopy images, its increase with load, and the improved resolution of lateral force images. The correct interaction stiffness can be obtained for use in surface force and mechanical properties studies. The need for complementary stiffness and topological data is emphasized.