Fission fragment detection by thin film capacitors—I: Breakdown counter
- 31 December 1977
- journal article
- Published by Elsevier in Nuclear Track Detection
- Vol. 1 (1) , 63-70
- https://doi.org/10.1016/0145-224x(77)90024-2
Abstract
No abstract availableKeywords
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- The maximum dielectric strength of thin silicon oxide filmsIEEE Transactions on Electron Devices, 1966