Measurement of Misalignments between the [111] Axes of GaP Deposits and Si Substrates by the X-Ray Divergent Beam Method
- 1 August 1976
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 15 (8) , 1435-1444
- https://doi.org/10.1143/jjap.15.1435