Imaging of the Fermi Surface of 1T-Ta0.9Hf0.1S2 by X-Ray Diffuse Scattering

Abstract
Using x-ray diffuse scattering, we have observed enhanced Kohn anomalies in the two-dimensional conductor Ta0.9 Hf0.1 S2. From this, we have deduced the shape of the Fermi surface of this compound throughout a wide region of reciprocal space. The results in the (h0l) planes demonstrate the two-dimensionality of the electronic states in this substance. The results in the layers h, k, ±13 prove that the topographic shape originally postulated by Williams, Parry, and Scruby is correct.