Comparisons of block diagram and Markov method system reliability and mean time to failure results for constant and non-constant unit failure rates
- 1 March 1997
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 37 (3) , 505-509
- https://doi.org/10.1016/0026-2714(95)00180-8
Abstract
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