Data Retention in EPROMS

• 1 April 1980
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE) in 8th Reliability Physics Symposium
• No. 07350791,p. 238-243
• https://doi.org/10.1109/irps.1980.362947

Abstract

Keywords

• EPROM
• NONVOLATILE MEMORY
• VOLTAGE
• APPLICATION SOFTWARE
• ELECTRON TRAPS
• VARIABLE STRUCTURE SYSTEMS
• PROM
• MICROPROCESSORS
• ERROR CORRECTION
• SYSTEM SOFTWARE