An Economical Electronic Roughness Sampler, For Radar Land Studies
- 24 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 3, 1181-1184
- https://doi.org/10.1109/igarss.1989.576036
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- C -Band Backscatter Sensitivity To Multi - Scale Geometry And Soil Moisture Variability Of Agricultural SurfacesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Review Article Procedures for the description of agricultural crops and soils in optical and microwave remote sensing studiesInternational Journal of Remote Sensing, 1987