Photoemission studies of surface core‐level shifts and their applications

Abstract
Surface core‐level shifts measured using photoemission with synchrotron radiation are reviewed for a variety of transition metals (Ta, W, Ir), rare earth metals (Yb, Sm, Gd, YbAl2), noble metals(Au), and semiconductors (Si, Ge, GaAs). Models of surface shifts are discussed, including the relationships of surface shifts to surface crystallography, reconstruction, valence electron configuration, surface cohesive energy, etc. Applications of surface shifts which are described include surface reconstruction on metals and semiconductors and high‐resolution chemisorption studies.

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