Transmission Electron Microscopy and X-Ray Diffraction Studies of a,b-Axis Oriented YBa2Cu3O7-δ Films
- 1 January 1992
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- The atomic structure of growth interfaces in Y–Ba–Cu–O thin filmsJournal of Materials Research, 1991
- All a-axis oriented YBa2Cu3O7−y-PrBa2Cu3O7−z-YBa2Cu3O7−y Josephson devices operating at 80 KApplied Physics Letters, 1991
- Microstructure of ultrathin films of on MgOPhysical Review B, 1991
- Fabrication of Eu/sub 1/Ba/sub 2/Cu/sub 3/O/sub y/ thin films and tunnel junctions by magnetron sputteringIEEE Transactions on Magnetics, 1991
- A -Axis—Oriented YBa 2 Cu 3 O 7 /PrBa 2 Cu 3 O 7 SuperlatticesScience, 1991
- Synthesis and properties of YBa2Cu3O7 thin films grown in situ by 90° off-axis single magnetron sputteringPhysica C: Superconductivity and its Applications, 1990
- Epitaxial and Smooth Films of a -Axis YBa 2 Cu 3 O 7Science, 1990
- Anisotropic proximity coupling in small YBa2Cu3O7-normal-Pb junctionsApplied Physics Letters, 1990
- Crystal structures of high-T c oxidesZeitschrift für Physik B Condensed Matter, 1989
- Diffraction from MaterialsPhysics Today, 1978