Characterization of ITO/CuPc/AI and ITO/ZnPc/Al structures using optical and capacitance spectroscopy
- 2 June 2003
- journal article
- Published by Elsevier in Synthetic Metals
- Vol. 138 (1-2) , 33-37
- https://doi.org/10.1016/s0379-6779(02)01284-5
Abstract
No abstract availableKeywords
This publication has 23 references indexed in Scilit:
- Fundamentals of Impedance SpectroscopyPublished by Wiley ,2018
- Device characteristics of lateral and vertical type organic field effect transistorsThin Solid Films, 2001
- Influence of trapped and interfacial charges in organic multilayer light-emitting devicesJournal of Applied Physics, 2001
- Monochromatic versus solar efficiencies of organic solar cellsSolar Energy Materials and Solar Cells, 1999
- Characterization of ITO—PPHT—metal contacts (PPHT=poly(3-phenylhydrazone thiophene)) using electrical and capacitance measurementsSynthetic Metals, 1998
- Temperature dependent broadband impedance spectroscopy on poly-(p-phenylene-vinylene) light-emitting diodesJournal of Applied Physics, 1998
- Light-emitting diodes based on poly-p-phenylene-vinylene: II. Impedance spectroscopyJournal of Applied Physics, 1997
- Electrocatalytic oxidation of cysteine by molybdenum(V) phthalocyanine complexesJournal of Electroanalytical Chemistry, 1996
- Photonic Devices Based on Crystalline Organic Semiconductors for Optoelectronic Integrated CircuitsJapanese Journal of Applied Physics, 1995
- Influence of the structure and morphology on the sensitivity to nitrogen oxides of phthalocyanine thin-film resistivity sensorsSensors and Actuators, 1989