Resonant frustrated-total-reflection technique for the characterization of thin films
- 15 June 1982
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 21 (12) , 2167-2173
- https://doi.org/10.1364/ao.21.002167
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 3 references indexed in Scilit:
- Guided optics techniques for investigation of filmsCanadian Journal of Physics, 1979
- An Evaluation of the Prism Coupler for Measuring the Thickness and Refractive Index of Dielectric Films on Silicon SubstratesJournal of the Electrochemical Society, 1979
- MODES OF PROPAGATING LIGHT WAVES IN THIN DEPOSITED SEMICONDUCTOR FILMSApplied Physics Letters, 1969