Film head domain observations at wafer processing level

• 1 January 1992
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 6
• https://doi.org/10.1109/intmag.1992.696189

Abstract

Keywords

• MAGNETIC HEADS
• STRESS
• MICROMAGNETICS
• SHAPE
• MAGNETOSTRICTION
• FREQUENCY
• KERR EFFECT
• MICROSCOPY
• PROBES
• BARS