Observation of Microcracks and Thin Intergranular Films in Ceramics by Transmission Electron Microscopy
- 1 January 1980
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 63 (1-2) , 104-106
- https://doi.org/10.1111/j.1151-2916.1980.tb10660.x
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Microstructure of Y2O3 Fluxed Hot‐Pressed Silicon NitrideJournal of the American Ceramic Society, 1978
- Grain Boundary Phases in a Hot‐Pressed MgO Fluxed Silicon NitrideJournal of the American Ceramic Society, 1977
- Direct Observation of Lattice Planes at Grain Boundaries in Silicon NitridePublished by Springer Nature ,1977
- Optical CrystallographyPhysics Today, 1960