Abstract
A crystallographic treatment is developed which clarifies the relation between the structure of a grain boundary and its location between relatively translated crystals. Characterization of line defects which can exist in grain boundaries is also facilitated by using this treatment, and the following topics are considered: (1) the computed structures in part I of this work; (2) steps at the cores of perfect grain boundary dislocations; (3) boundary structures related by c.s.l. symmetry; (4) partial grain boundary dislocations. Transmission electron microscope observations of topic 4 are presented.

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