Angle and Thickness Dependence of the FMR Linewidth in High Quality Ni[Single Bond]Fe Thin Films
- 1 January 1973
- conference paper
- Published by AIP Publishing
- Vol. 10 (1) , 135-137
- https://doi.org/10.1063/1.2946792
Abstract
Measurements of linewidth versus angle between the static field and the film plane have been made at 9 GHz for high quality Ni 3 Fe films 300–2700 Å thick. Both the parallel and perpendicular frequency linewidths increase with thickness, and the increase is more rapid for parallel FMR. The data for 300 Å films can be fitted with a constant Landau‐Lifshitz damping. The difference between the parallel and perpendicular linewidths [ Δ(ω/γ) ∥ −Δ(ω/γ) ⊥ ] shows a striking thickness dependence indicative of two‐magnon relaxation.Keywords
This publication has 0 references indexed in Scilit: