Finite size effect on the current enhancement at the tip of a long defect in a resistor network
- 7 August 1990
- journal article
- Published by IOP Publishing in Journal of Physics A: General Physics
- Vol. 23 (15) , 3591-3601
- https://doi.org/10.1088/0305-4470/23/15/029
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Electrical breakdown in a fuse network with random, continuously distributed breaking strengthsPhysical Review B, 1988
- Size and location of the largest current in a random resistor networkPhysical Review B, 1987
- Size Effects of Electrical Breakdown in Quenched Random MediaPhysical Review Letters, 1987
- Breakdown properties of quenched random systems: The random-fuse networkPhysical Review B, 1987
- Size Effects of Electrical Breakdown in Quenched random MediaPhysical Review Letters, 1986
- Stress Intensity FactorsJournal of Applied Mechanics, 1983