Secondary ion production by latent energy of neutrally emitted particles
- 1 April 1985
- journal article
- Published by Elsevier in Surface Science
- Vol. 152-153, 127-134
- https://doi.org/10.1016/0039-6028(85)90135-9
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Auger electron emission from the decay of collisionally-excited atoms sputtered from Al and SiNuclear Instruments and Methods in Physics Research, 1983
- Secondary ion emission by nonadiabatic dissociation of nascent ion molecules with energies depending on solid compositionZeitschrift für Physik B Condensed Matter, 1983
- Secondary ion emission by nonadiabatic dissociation of nascent ion molecules with energies depending on solid compositionZeitschrift für Physik B Condensed Matter, 1983
- Neutralization in ion-surface collisions: II. Nonperturbative resultsSurface Science, 1982
- Secondary ion mass spectrometry as a means of surface analysisSurface Science, 1979
- Experimental and theoretical approaches to the ionization process in secondary-ion emissionSurface Science, 1979
- The sputtering process and sputtered ion emissionSurface Science, 1979
- Characteristics of ion-excited silicon L-shell Auger spectraSurface Science, 1979
- Ion-induced auger electron emission of Mg, Al and Si as a function of ion energySurface Science, 1979
- Empirical formula for the calculation of secondary ion yields from oxidized metal surfaces and metal oxidesSurface Science, 1977