LEED-AES and XPS Studies of Bi-Sr-Ca-Cu-O Single Crystal Surfaces
- 1 March 1989
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 28 (3A) , L406
- https://doi.org/10.1143/jjap.28.l406
Abstract
The well-defined clean surface in the 80K-phase Bi-Sr-Ca-Cu-O single crystal was obtained by cleaving it in air and heating it at 350°C in ultrahigh vacuum (UHV). The low-energy electron diffraction (LEED) pattern from the clean surface showed the perfect single domain of a 1×5 structure. From the Auger electron spectroscopy (AES) measurements, the cleaved surface might be a Bi-O layer and O atoms will be removed more easily than the other elements of Sr, Ca and Cu by Ar+ sputter etching. In the clean surface of the single crystal, Cu2+ was dominant. The X-ray photoelectron spectroscopy (XPS) spectrum of O 1s consists of the OH(∼531 eV) and OL(∼529 eV) components, and the OH component is smaller than the OL component.Keywords
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