Changes in Composition during Electron Micro-Probe Analysis of K2O–SrO–SiO2 Glass
- 1 April 1966
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 37 (5) , 2199
- https://doi.org/10.1063/1.1708778
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Oxygen Outgassing Caused by Electron Bombardment of GlassJournal of Applied Physics, 1963
- Energy Dissipation and Secondary Electron Emission in SolidsPhysical Review B, 1961
- Electron Probe MicroanalysisPublished by Elsevier ,1960
- Electron Bombardment Effects in Thin Dielectric LayersProceedings of the Physical Society. Section B, 1955