Trap Centers in MNOS Memory Devices Measured by Thermally Stimulated Currents

• 1 October 1973
• journal article
• Published by IOP Publishing in Japanese Journal of Applied Physics
• Vol. 12  (10) , 1633-1634
• https://doi.org/10.1143/jjap.12.1633

Abstract

Keywords

• DEVICES MEASURED
• TRAP CENTERS
• MNOS MEMORY
• MEMORY DEVICES
• STIMULATED
• THERMALLY
• CENTERS IN MNOS