High Resolution Dark Field Microscopy Using a Philips 100B Electron Microscope

1 May 1965

journal article
research article
Published by AIP Publishing in Review of Scientific Instruments

Vol. 36 (5) , 654-656
https://doi.org/10.1063/1.1719657

Abstract

A simple modification to a Philips 100B electron microscope makes possible the production of dark field images without any loss of resolution. The method utilizes electrical tilting of the primary beam and permits rapid alternation between bright and dark field viewing.

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