Structure analysis of Si(111)2©1 with low-energy electron diffraction
- 15 August 1984
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 30 (4) , 2257-2259
- https://doi.org/10.1103/physrevb.30.2257
Abstract
A structure analysis of the Si(111)2©1 surface is performed using extensive new low-energy electron-diffraction data (12 beams). Although the -bonded chain model in its original form shows gross disagreement with low-energy electron diffraction, a modification of that structure gives moderate agreement. The major modifications are a buckling in the outer chain and an overall compression.
Keywords
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