Ellipsometry: a technique for real time monitoring and analysis of MBE-grown CdHgTe and CdTe/HgTe superlattices
- 1 February 1992
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 117 (1-4) , 166-170
- https://doi.org/10.1016/0022-0248(92)90738-5
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- MBE growth and characterization of Hg-based superlatticesJournal of Crystal Growth, 1989
- Kinetics of molecular‐beam epitaxial HgCdTe growthJournal of Vacuum Science & Technology A, 1988
- Molecular‐beam epitaxy of CdxHg1−xTe at D.LETI/LIRJournal of Vacuum Science & Technology A, 1988