Superstructure in chemically etched poly(ethylene terephthalate)

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Abstract
The new technique of contact etching has been utilized to study the bulk morphology of polyethylene terephthalate by the echant, n-propylamine. A variety of films and fibers with different mechanical and thermal histories have been subjected to contact etching. The sample surfaces have been studied principally by scanning electron microscopy. A network superstructure with its characteristic dimension (thickness) of from 700 to 3000 Å, depending on sample history, has been observed. In the oriented samples the network superstructure aligns perpendicular to the direction of sample orientation. A simple model is proposed to describe the network superstructure which is believed to be moderately crystalline.