Anomalous expansion of tungsten-carbon multilayers used in x-ray optics
- 1 October 1986
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 60 (7) , 2301-2303
- https://doi.org/10.1063/1.337192
Abstract
Using microcleavage transmission electron microscopy and x-ray diffraction, we have studied the anomalous expansion observed in tungsten-carbon multilayers. Our results show that the expansion is mostly due to an agglomeration of the tungsten and the effect is larger for samples that have a thinner tungsten layer. Implications for soft x-ray optics are discussed.This publication has 3 references indexed in Scilit:
- Stability of multilayers for synchrotron opticsApplied Physics Letters, 1986
- The renaissance of x-ray opticsPhysics Today, 1984
- A Scanning Soft X-Ray Microscope Using Normal Incidence MirrorsPublished by Springer Nature ,1984