Measurement of the X-Ray Sensitivity of Silicon Diodes in the Energy Region 1.8 to 5.0 KeV

This publication has 2 references indexed in Scilit:

• A total absorption ionization chamber for 1.5–10 keV X rays
  Nuclear Instruments and Methods, 1971
• Microanalysis with Ultrasoft X-Radiations
  Published by Springer Nature ,1962