An in situ XPS study of sputter-deposited aluminium thin films on graphite
- 1 July 1994
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 78 (3) , 219-231
- https://doi.org/10.1016/0169-4332(94)90009-4
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
- Determination of attenuation lengths of photoelectrons in aluminium and aluminium oxide by angle‐dependent x‐ray photoelectron spectroscopySurface and Interface Analysis, 1993
- STM study of sputter-deposited Al clusters in chemical interaction with graphite (0001) surfacesSurface Science, 1992
- Chemistry of the interface between aluminium and polyethyleneterephthalate by XPSApplied Surface Science, 1991
- Intercomparison of surface analysis of thin aluminium oxide filmsSurface and Interface Analysis, 1990
- XPS study of metal/polymer interaction: Evaporated aluminum on polyvinyl alcohol polymerSurface and Interface Analysis, 1990
- Aluminum deposition on polyimides: The effect of i n s i t u ion bombardmentJournal of Vacuum Science & Technology A, 1989
- Scanning tunneling microscopy of Cu, Ag, Au and Al adatoms, small clusters, and islands on graphiteSurface Science, 1989
- Island formation of aluminum on the graphite (0001) surface: Leed and AES studySurface Science, 1988
- Aluminum/polyimide interface formation: An x-ray photoelectron spectroscopy study of selective chemical bondingJournal of Vacuum Science & Technology A, 1987
- Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solidsSurface and Interface Analysis, 1979