In-beam measurement ofE0matrix element inSe72andGe72

Abstract
A 0 + state in Se72 at 936 keV has been identified through in-beam measurements with Ge70(α,2n)Se72. The beam-related time distribution of conversion electrons from the 936-keV E0 transition yields a half-life of 19.3±0.4 ns. With a Ge72 target and an α-beam sweeper the half-life of the 690-keV E0 transition in Ge72 was 404±45 ns. For both transitions identification of the emitting nucleus was obtained from the energy separation of the K and L electrons. The KL intensity ratio was intermediate between the theoretical results of Hager and Seltzer and those of Church and Weneser. The reduced E0 nuclear matrix elements are ρ=(0.304±0.003)(15.01×103f) and ρ=0.095±0.005 for Se72 and Ge72, respectively, which are 0.77 (for f40) and 0.24, respectively, of Wilkinson's suggested single-particle unit for E0 matrix elements. The f is the 0′→2 enhancement.