Frequency-scanned deep-level transient spectroscopy
- 15 January 1985
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 57 (2) , 628-630
- https://doi.org/10.1063/1.334753
Abstract
The output signal in a deep-level transient spectroscopy experiment is a function of both the rate-window settings and sample temperature. Usually, the rate window is held fixed and the temperature scanned to produce the deep-level spectrum. We will demonstrate that a deep-level spectrum can also be obtained by fixing the temperature and scanning the rate window.This publication has 7 references indexed in Scilit:
- Defect Symmetry from Stress Transient SpectroscopyPhysical Review Letters, 1983
- Symmetry determination for deep states in semiconductors from stress-induced dichroism of photocapacitanceJournal of Applied Physics, 1983
- Charge transient spectroscopyApplied Physics Letters, 1982
- Deep level transient spectroscopy of neutron irradiated semiconductorsJournal of Nuclear Materials, 1982
- Oxygen-related donor states in siliconApplied Physics Letters, 1981
- Determination of deep levels in Cu-doped GaP using transient-current spectroscopyJournal of Applied Physics, 1976
- Deep-level transient spectroscopy: A new method to characterize traps in semiconductorsJournal of Applied Physics, 1974