Fraction of ionization from electrons arising in the wall of an ionization chamber

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Abstract
The accuracy of high-energy X-ray dosimetry can be improved by taking account of differences between the compositions of the chamber wall and the buildup cap or dosimetry phantom. The fraction of the ionization due to secondary electrons arising in the chamber wall has been determined as a function of wall thickness for 60Co .gamma.-rays and X-rays in the range of 2-25 MV for Farmer-type chambers. Secondary electrons arising in the accelerator head were removed from the X-ray beams by a magnetic field placed just in front of the ionization chamber. For 60Co .gamma.-rays, the fraction increases from 40 to 100% as the wall thickness increases from 0.05 to 0.55 g cm-2. For a 0.05 g cm-2 wall, fraction decreases from 60 to 10% as the X-ray energy is increased from 2 to 25 MV. Limited data obtained with different chambers suggest that the fraction is independent of chamber wall composition when the thickness is expressed in g cm-2.

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