High resolution x-ray analysis of pseudomorphic InGaN/GaN multiple quantum wells: Influence of Si doping concentration
- 1 March 1999
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 85 (5) , 3006-3008
- https://doi.org/10.1063/1.369620
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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