Correlation between charge and current corrugations in scanning-tunneling microscopy
- 15 January 1987
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 35 (3) , 1433-1436
- https://doi.org/10.1103/physrevb.35.1433
Abstract
The aim of this paper is to investigate how charge and current corrugations in scanning-tunneling microscopy are compared. A Si(111) surface is analyzed and a method to calculate tunneling currents from localized states is proposed. The main result of this model is that charge corrugations are always greater than current corrugations, although they only differ significantly for large corrugations.Keywords
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