A high-level EDA environment for the automatic insertion of HD-BIST structures
- 20 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- HIST: A METHODOLOGY FOR THE AUTOMATIC INSERTION OF A HIERARCHICAL SELF TESTPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- A distributed BIST control scheme for complex VLSI devicesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Implementing macro test in silicon compiler designIEEE Design & Test of Computers, 1990