Evaluation of spatial Green's functions for microstrips:fastHankel transform algorithm and complex image method
- 28 May 1998
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 34 (11) , 1110-1111
- https://doi.org/10.1049/el:19980787
Abstract
The fast Hankel transform (FHT) algorithm and complex image method (CIM) are employed to evaluate the spatial-domain Green's function for a multilayered microstrip structure. The results are compared with those obtained by exact numerical integration. It is found that both techniques have high efficiency and the FHT has better accuracy than the CIM.Keywords
This publication has 2 references indexed in Scilit:
- A robust approach for the derivation of closed-form Green's functionsIEEE Transactions on Microwave Theory and Techniques, 1996
- A closed-form spatial Green's function for the thick microstrip substrateIEEE Transactions on Microwave Theory and Techniques, 1991