Optical Properties of Copper Oxide Films
- 1 January 1966
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 37 (1) , 184-187
- https://doi.org/10.1063/1.1707803
Abstract
The transmittance and reflectance of CuO0.67 and CuO films ranging in thickness from 392 to 2335 Å have been measured in the wavelength region of 400 to 800 mμ. These data were used to obtain the wavelength dependence of the optical constants of these materials. Differences between the optical properties of CuO0.67 and Cu2O are attributed to differences in stoichiometry rather than to size effects. A method for measuring absolute reflectance is described.This publication has 5 references indexed in Scilit:
- Hopping Conduction in NiOPhysical Review Letters, 1965
- THE OXIDATION OF COPPER FILMS TO CuO0.67The Journal of Physical Chemistry, 1962
- Refractive index of Cu2O crystals in region up to 10 μCzechoslovak Journal of Physics, 1961
- Optical Properties of Nickel OxidePhysical Review B, 1959
- Optical spectrum of excitons in the crystal latticeIl Nuovo Cimento (1869-1876), 1956