Abstract
Visual matching of experimental and theoretical electron micrographs can be used to determine the apparent anomalous absorption constant. The method has been applied to a copper-silicon (8 at. % Si) alloy by matching experimental and theoretical images of a Shockley partial dislocation and the main and subsidiary fringes of the associated stacking fault. The value of 0�067 which is obtained is considerably less than the value of 0�1 usually assumed for metals and alloys. In foils approximately 3611 thick details of the image are very sensitive to the value ofthe anomalous absorption constant and the value of 0�1 is inadequate for image matching. However, in foils approximately 6611thick the general topological features of an image are little altered by varying the anomalous absorption constant over a wide range and the approximate value of O� 1 is adequate for image matching.

This publication has 0 references indexed in Scilit: