Topographic measurements of supersmooth dielectric films made with a mechanical profiler and a scanning force microscope

1 January 1995

journal article
Published by Optica Publishing Group in Applied Optics

Vol. 34 (1) , 209-212
https://doi.org/10.1364/ao.34.000209

Abstract

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Keywords

OPTICS
PHOTONICS
LASER
OPTICAL
FIBER OPTICS
SPECTROCOPY
MEDICAL IMAGING
TELECOMMUNICATIONS
LIGHT
SOCIETY
SCIENCE
RESEARCH
PROCEEDINGS
JOURNALS
PUBLICATIONS
INTERNATIONAL

This publication has 1 reference indexed in Scilit:

Stylus profiling instrument for measuring statistical properties of smooth optical surfaces
Applied Optics, 1981