Statistical IC simulation based on independent wafer extracted process parameters and experimental designs
- 13 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 262-265
- https://doi.org/10.1109/bipol.1989.69505
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- A statistical model including parameter matching for analog integrated circuits simulationIEEE Transactions on Electron Devices, 1985
- Statistical Simulation of the IC Manufacturing ProcessIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1982
- Experimental study of Gummel-Poon model parameter correlations for bipolar junction transistorsIEEE Journal of Solid-State Circuits, 1977