Molecular dynamics simulations to explore the effect of projectile size on the ejection of organic targets from metal surfaces
- 31 March 1998
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Processes
- Vol. 174 (1-3) , 155-166
- https://doi.org/10.1016/s0168-1176(97)00299-1
Abstract
No abstract availableKeywords
This publication has 35 references indexed in Scilit:
- Secondary ion emission under cluster impact at low energies (5–60 keV); influence of the number of atoms in the projectileNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1994
- Ion desorption from organic and inorganic targets induced by 100 keV gold cluster ionsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1994
- Ion beams and laser postionization for molecule-specific imagingAnalytical Chemistry, 1993
- Surface MS: probing real-world samplesAnalytical Chemistry, 1993
- Molecular dynamics simulation of nonlinear effects in sputtering — Au(100) and Au(111) targetsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1991
- Impact of slow gold clusters on various solids: nonlinear effects in secondary ion emissionNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1991
- Molecular dynamics simulations of energetic cluster impacts on Al, Cu and Au targetsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1991
- Surface characterization with keV clusters and MeV ionsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1990
- Secondary-ion yields from surfaces bombarded with keV molecular and cluster ionsPhysical Review Letters, 1989
- Comparison of polyatomic and atomic primary beams for secondary ion mass spectrometry of organicsAnalytical Chemistry, 1989