Secondary ion mass spectrometry of organic compounds
- 1 January 1983
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics
- Vol. 46, 463-466
- https://doi.org/10.1016/0020-7381(83)80152-1
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- High-resolution secondary ion mass spectrometry (SIMS) for use in chemistryInternational Journal of Mass Spectrometry and Ion Physics, 1981