Integration testing using interface mutation
- 23 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 10719658,p. 112-121
- https://doi.org/10.1109/issre.1996.558719
Abstract
A criterion for assessing the adequacy of test sets during integration testing is proposed. The criterion is based on a testing technique named Interface Mutation. The technique itself is designed to be scalable with the size of the software under test; the size being measured in the number of subsystems integrated. Using Interface Mutation it is possible to assess the adequacy of tests incrementally while integrating various subsystems. Also reported are results from a pilot experiment conducted to study the cost and error defection effectiveness of Interface Mutation.Keywords
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