Simple Contactless Method for Measuring Decay Time of Photoconductivity in Silicon
- 1 January 1967
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 38 (1) , 133-134
- https://doi.org/10.1063/1.1720508
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Radio-Frequency Carrier and Capacitive Coupling Procedures for Resistivity and Lifetime Measurements on SiliconJournal of the Electrochemical Society, 1961
- Lifetime Measurements of Excess Carriers in SemiconductorsJournal of Applied Physics, 1956