On Gunn Instability in Two-Dimensional Semiconductors
- 1 August 1978
- journal article
- Published by Physical Society of Japan in Journal of the Physics Society Japan
- Vol. 45 (2) , 707-708
- https://doi.org/10.1143/jpsj.45.707
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Differential Negative Resistance of n-Type Inversion Layer in Silicon MOS Field-Effect TransistorApplied Physics Letters, 1972