Electro-optic sampling of fast electrical signals using an InGaAsP injection laser

16 January 1986

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 22 (2) , 61-62
https://doi.org/10.1049/el:19860041

Abstract

We demonstrate a new electro-optic sampling system for the measurements of fast electrical waveforms at gigahertz repetition rates. The system uses a mode-locked InGaAsP injection laser as a source of sampling pulses and employs the electro-optic effect in the GaAs substrate of a microstrip line.

Keywords

FAST ELECTRICAL SIGNALS
GAAS SUBSTRATE
MICROSTRIP LINE
MODE-LOCKED INGAASP INJECTION LASER
SEMICONDUCTOR LASER
ELECTRO-OPTIC SAMPLING SYSTEM

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