Optical and electrical properties of preferentially anisotropic single-walled carbon-nanotube films in terahertz region
- 15 May 2004
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 95 (10) , 5736-5740
- https://doi.org/10.1063/1.1699498
Abstract
The absorption and dispersion of aligned single-walled carbon-nanotube films were measured from 0.2 to 2.0 THz using a source of freely propagating subpicosecond pulses of THz electromagnetic radiation. The real conductivity increased rapidly with increasing frequency up to 0.45 THz and decreased at a high-frequency range. The Maxwell–Garnett model, where the nanotubes were embedded in a dielectric host, fit the results of this study with the Drude–Lorentz model for nanotube network. We have observed the transverse phonon mode of 2.4 THz propagating along the c direction. This suggested that the carbon nanotube network is composed of metallic and semiconducting nanotubes embedded in an air dielectric host.This publication has 14 references indexed in Scilit:
- The conductivity of single walled nanotube films in Terahertz regionPhysics Letters A, 2003
- Terahertz conductivity of anisotropic single walled carbon nanotube filmsApplied Physics Letters, 2002
- Transport phenomena in an anisotropically aligned single-wall carbon nanotube filmPhysical Review B, 2001
- Low pressure synthesis of single-walled carbon nanotubes by arc dischargeSynthetic Metals, 2001
- High-Yield Purification Process of Singlewalled Carbon NanotubesThe Journal of Physical Chemistry B, 2001
- Crossed Nanotube JunctionsScience, 2000
- Localized and delocalized charge transport in single-wall carbon-nanotube matsPhysical Review B, 2000
- Far-infrared gaps in single-wall carbon nanotubesPhysical Review B, 1999
- Terahertz electromagnetic pulses as probes for transient velocity overshoot in GaAs and SiJournal of the Optical Society of America B, 1994
- Far-infrared time-domain spectroscopy with terahertz beams of dielectrics and semiconductorsJournal of the Optical Society of America B, 1990