Measurement of Magnetostriction of Thin Films by an Optical Displacement Meter
- 1 July 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Translation Journal on Magnetics in Japan
- Vol. 3 (7) , 577-579
- https://doi.org/10.1109/tjmj.1988.4563798
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Magnetoelastic contribution to perpendicular anisotropy in amorphous Gd-Co and Gd-Fe filmsIEEE Transactions on Magnetics, 1978
- Variable delay lines using magnetostrictive metallic-glass film overlaysJournal of Applied Physics, 1978
- The measurement of magnetostriction in ferromagnetic thin filmsIEEE Transactions on Magnetics, 1976
- Measurement of Magnetostriction in Single CrystalsPhysical Review B, 1953