Kinetics of Contact Wearout for Silicided (TiSi2) and Non-Silicided Contacts
- 1 April 1987
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in 8th Reliability Physics Symposium
- p. 154-160
- https://doi.org/10.1109/irps.1987.362172
Abstract
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