X-ray induced fluorescence spectrometry at grazing incidence for quantitative surface and layer analysis
- 1 January 1991
- journal article
- Published by Springer Nature in Analytical and Bioanalytical Chemistry
- Vol. 341 (1-2) , 83-86
- https://doi.org/10.1007/bf00322113
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Determination of trace element impurities in ultrapure reagents by total reflection X-ray spectrometrySpectrochimica Acta Part B: Atomic Spectroscopy, 1991
- Total reflection X-ray spectrometry: method and applicationsSpectrochimica Acta Part B: Atomic Spectroscopy, 1989
- Application of total reflection X-ray fluorescence in semiconductor surface analysisSpectrochimica Acta Part B: Atomic Spectroscopy, 1989