Improved Semiautomatic Histogram Plotter

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Abstract
An improved instrument for constructing particle size distribution diagrams from electron micrographs is described. Its use permits the measurement of large numbers of particles rapidly, and with low observer fatigue. The magnification of the image to be measured may be chosen to make the instrument error less than the resolution of the electron microscope. The device consists of a measuring unit in the form of a pair of dividers, controlling a servo system which automatically classifies the particles and plots the histogram as an array of steel balls in a slotted matrix. Adjustments for zero and span are provided, and the total number of particles measured is recorded.

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