Marginal fault diagnosis based on e-beam static fault imaging with CAD interface

Publisher Website

4 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/test.1990.114129

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Rapid data acquisition for e-beam testing
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of VLSI Circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1986